Characterization of crystal growth defects by X-ray methods /

Bibliographic Details
Corporate Author:	NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods Durham University, England
Other Authors:	Tanner, B. K. (Brian Keith), Bowen, D. Keith (David Keith), 1940-
Format:	Conference Proceeding Book
Language:	English
Published:	New York, N.Y. : Plenum Press, [1980]
Series:	NATO advanced study institutes series. Physics ; v. 63.
Subjects:	Crystals > Defects > Congresses. X-ray crystallography > Congresses.

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