Modern optical characterization techniques for semiconductors and semiconductor devices : 26-27 March 1987, Bay Point, Florida /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, Metallurgical Society (U.S.)
Other Authors:	Glembocki, O. J., Pollak, Fred H., Song, Jin-Joo
Format:	Book
Language:	English
Published:	Bellingham, Wash. : SPIE--The International Society for Optical Engineering, [1987]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 794.
Subjects:	Spectrum analysis > Congresses. Semiconductors > Testing > Congresses. Raman spectroscopy > Congresses.

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