Phenomenes critiques, systemes aleatoires, theories de jauge = Critical phenomena, random systems, gauge theories /
| Corporate Authors: | , |
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| Other Authors: | , , |
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Amsterdam ; New York :
North-Holland ;
1986.
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| Subjects: |
Evans: Library Stacks
| Call Number: |
QC173.4.C74 P47 1986 |
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|---|---|---|
| Library Owns: QC173.4.C74 P47 1986 | (v.1-v.2) | |
| Call Number | Status | Get It |
| QC173.4.C74 P47 1986 v.1 | Available | |
| QC173.4.C74 P47 1986 v.2 | Available | |