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LSI/VLSI testability design /

Bibliographic Details
Main Author: Tsui, Frank F.
Format: Book
Language:English
Published: New York : McGraw-Hill, [1987]
Subjects:
Integrated circuits > Large scale integration > Testing.
Integrated circuits > Very large scale integration > Testing.
Description
Item Description:Includes index.
Physical Description:xv, 702 pages : illustrations ; 24 cm.
Bibliography:Bibliography: pages 591-684.
ISBN:0070653410 :