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LSI/VLSI testability design /

Bibliographic Details
Main Author: Tsui, Frank F.
Format: Book
Language:English
Published: New York : McGraw-Hill, [1987]
Subjects:
Integrated circuits > Large scale integration > Testing.
Integrated circuits > Very large scale integration > Testing.

Remote Storage

Holdings details from Remote Storage
Call Number: TK7874 .T78 1987
 
Call Number Status Get It
TK7874 .T78 1987 Available