International Topical Meeting on Image Detection and Quality Paris, France, Société française d'optique, & Association nationale de la recherche technique. (1986). Proceedings: International Topical Meeting on Image Detection and Quality, 16-18 July 1986, Paris, France. [SPIE].
Chicago Style (17th ed.) CitationInternational Topical Meeting on Image Detection and Quality Paris, France, Société française d'optique, and Association nationale de la recherche technique. Proceedings: International Topical Meeting on Image Detection and Quality, 16-18 July 1986, Paris, France. [Paris]: [SPIE], 1986.
MLA (9th ed.) CitationInternational Topical Meeting on Image Detection and Quality Paris, France, et al. Proceedings: International Topical Meeting on Image Detection and Quality, 16-18 July 1986, Paris, France. [SPIE], 1986.