Proceedings : International Topical Meeting on Image Detection and Quality, 16-18 July 1986, Paris, France /

Bibliographic Details
Corporate Authors:	International Topical Meeting on Image Detection and Quality Paris, France, Société française d'optique, Association nationale de la recherche technique
Format:	Conference Proceeding Book
Language:	English French
Published:	[Paris] : [SPIE], [1986?]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 702.
Subjects:	Imaging systems > Congresses. Imaging systems > Image quality > Congresses.
Online Access:	https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/0702.toc

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