Thin film and depth profile analysis /
| Other Authors: | , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Berlin ; New York :
Springer-Verlag,
1984.
|
| Series: | Topics in current physics ;
37. |
| Subjects: |
| Physical Description: | xi, 205 pages : illustrations |
|---|---|
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0387133208 (U.S.) |