Cover Image

The three faces of test : design, characterization, production : proceedings /

Bibliographic Details
Corporate Authors: International Test Conference Philadelphia, Pa., IEEE Computer Society. Test Technology Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format: Conference Proceeding Book
Language:English
Published: Silver Spring, MD : Los Angeles, CA : IEEE Computer Society Press ; Order from IEEE Computer Society, [1984]
Subjects:
Integrated circuits > Testing > Congresses.
Electronic digital computers > Circuits > Testing > Congresses.
Automatic test equipment > Congresses.
Description
Item Description:Cover title: IEEE 1984 Test Conference.
"IEEE catalog number 84CH2084-2."
"Computer Society order number 548."
Physical Description:xxxi, 886 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0818605480 (pbk.)
0818645482 (microfiche)
0818685484 (hard)