The three faces of test : design, characterization, production : proceedings /

Bibliographic Details
Corporate Authors:	International Test Conference Philadelphia, Pa., IEEE Computer Society. Test Technology Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format:	Conference Proceeding Book
Language:	English
Published:	Silver Spring, MD : Los Angeles, CA : IEEE Computer Society Press ; Order from IEEE Computer Society, [1984]
Subjects:	Integrated circuits > Testing > Congresses. Electronic digital computers > Circuits > Testing > Congresses. Automatic test equipment > Congresses.

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