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Applications of x-ray topographic methods to materials science /

Bibliographic Details
Corporate Authors: France-U.S.A. Seminar on Application of X-Ray Topographic Methods to Materials Science Snowmass Village, Colo., Centre national de la recherche scientifique (France), National Science Foundation (U.S.)
Other Authors: Weissmann, Sigmund, Balibar, Françoise, Petroff, Jean-François
Format: Conference Proceeding Book
Language:English
Published: New York : Plenum Press, [1984]
Subjects:
Radiography, Industrial > Congresses.
X-rays > Industrial applications > Congresses.
Description
Item Description:"Based on the proceedings of the France-U.S.A. Seminar on Application of X-Ray Topographic Methods to Materials Science, held August 7-10, 1983, in Snowmass Village, Colorado, which was sponsored jointly by CNRS and NSF"--Title page verso.
Physical Description:xiii, 536 pages : illustrations ; 26 cm.
Bibliography:Includes bibliographies and index.
ISBN:030641838X