Applications of x-ray topographic methods to materials science /

Bibliographic Details
Corporate Authors:	France-U.S.A. Seminar on Application of X-Ray Topographic Methods to Materials Science Snowmass Village, Colo., Centre national de la recherche scientifique (France), National Science Foundation (U.S.)
Other Authors:	Weissmann, Sigmund, Balibar, Françoise, Petroff, Jean-François
Format:	Conference Proceeding Book
Language:	English
Published:	New York : Plenum Press, [1984]
Subjects:	Radiography, Industrial > Congresses. X-rays > Industrial applications > Congresses.

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