Cover Image

Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 /

Bibliographic Details
Corporate Authors: IEEE Computer Society. Test Technology Committee, International Test Conference
Format: Conference Proceeding Book
Language:English
Published: Silver Spring, MD : IEEE Computer Society Press, [1983]
Subjects:
Integrated circuits > Testing > Congresses.
Integrated circuits > Very large scale integration > Testing > Congresses.
Electronic digital computers > Circuits > Testing > Congresses.
Description
Item Description:Cover title: 1983 Curriculum for Test Technology Workshop.
"IEEE Catalog number 83CH1978-6."
"For over a decade and a half the IEEE International Test Conference... has been an important annual event"--page 3.
Physical Description:vii, 173 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0818605200