Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 /

Bibliographic Details
Corporate Authors:	IEEE Computer Society. Test Technology Committee, International Test Conference
Format:	Conference Proceeding Book
Language:	English
Published:	Silver Spring, MD : IEEE Computer Society Press, [1983]
Subjects:	Integrated circuits > Testing > Congresses. Integrated circuits > Very large scale integration > Testing > Congresses. Electronic digital computers > Circuits > Testing > Congresses.

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