Cover Image

Measurement of change of thickness for a thin plate by holographic interferometry /

Bibliographic Details
Main Author: Hu, Ching-Piao
Corporate Author: National Science Foundation (U.S.)
Format: Book
Language:English
Published: Urbana : Dept. of Theoretical and Applied Mechanics, University of Illinois, [1974]
Series:T. & A.M. report ; no. 395.
Subjects:
Holography.
Laser interferometers.
Moiré method.
Plates (Engineering) > Testing.
Description
Item Description:"September 1974"
Physical Description:vi, 42 leaves : illustrations ; 28 cm.
Bibliography:Bibliography: leaves 41-42.