Measurement of change of thickness for a thin plate by holographic interferometry /

Bibliographic Details
Main Author:	Hu, Ching-Piao
Corporate Author:	National Science Foundation (U.S.)
Format:	Book
Language:	English
Published:	Urbana : Dept. of Theoretical and Applied Mechanics, University of Illinois, [1974]
Series:	T. & A.M. report ; no. 395.
Subjects:	Holography. Laser interferometers. Moiré method. Plates (Engineering) > Testing.

Remote Storage