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Technological risk : proceedings of a Symposium on Risk in New Technologies, first University Symposium, 15 December 1981, University of Waterloo /

Bibliographic Details
Corporate Authors: Symposium on Risk in New Technologies University of Waterloo, University of Waterloo
Other Authors: Lind, N. C. (Niels Christian), 1930-
Format: Conference Proceeding Book
Language:English
Published: Waterloo, Ontario : University of Waterloo Press, 1982.
Subjects:
Technology assessment > Congresses.
Risk > Congresses.
Description
Physical Description:viii, 185 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographies.
ISBN:088898040X