Technological risk : proceedings of a Symposium on Risk in New Technologies, first University Symposium, 15 December 1981, University of Waterloo /

Bibliographic Details
Corporate Authors:	Symposium on Risk in New Technologies University of Waterloo, University of Waterloo
Other Authors:	Lind, N. C. (Niels Christian), 1930-
Format:	Conference Proceeding Book
Language:	English
Published:	Waterloo, Ontario : University of Waterloo Press, 1982.
Subjects:	Technology assessment > Congresses. Risk > Congresses.

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