High resolution soft X-ray optics : November 18-20, 1981, Brookhaven, New York /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Spiller, Eberhard
Format:	Book
Language:	English
Published:	Bellingham, Wash. : SPIE--the International Society for Optical Engineering, [1982]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 316.
Subjects:	X-ray optics > Congresses. Resolution (Optics) > Congresses.

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