Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications, and trends /
| Main Author: | |
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| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
New York :
J. Wiley,
1987.
|
| Series: | Chemical analysis ;
v. 86. |
| Subjects: |
| Item Description: | "A Wiley-Interscience publication." Includes index. |
|---|---|
| Physical Description: | xxxv, 1227 pages : illustrations |
| Bibliography: | Bibliography: pages 1125-1216. |
| ISBN: | 0471010561 |