Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications, and trends /

Bibliographic Details
Main Author: Benninghoven, A.
Other Authors: RĂ¼denauer, F. G., Werner, H. W.
Format: Book
Language:English
Published: New York : J. Wiley, 1987.
Series:Chemical analysis ; v. 86.
Subjects:

Evans: Library Stacks

Holdings details from Evans: Library Stacks
Call Number: QD96.S43 B46 1987
 
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QD96.S43 B46 1987 Available