Cover Image

X rays in materials analysis : novel applications and recent developments : 21-22 August 1986, San Diego, California /

Bibliographic Details
Corporate Authors: University of Rochester. Institute of Optics, Society of Photo-optical Instrumentation Engineers
Other Authors: Rusch, Thomas William
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1986]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 690.
Subjects:
Nondestructive testing > Congresses.
X-ray spectroscopy > Congresses.
Materials > Testing > Congresses.
Description
Physical Description:vi, 156 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographies and index.
ISBN:0892527250 (pbk.)