X rays in materials analysis : novel applications and recent developments : 21-22 August 1986, San Diego, California /
| Corporate Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE--the International Society for Optical Engineering,
[1986]
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 690. |
| Subjects: |
Remote Storage
| Call Number: |
TA417.2 .X23 1986 |
|
|---|---|---|
| Call Number | Status | Get It |
| TA417.2 .X23 1986 | Available | |