Cover Image

Secondary ion mass spectrometry : SIMS V : proceedings of the fifth international conference, Washington, DC, September 30-October 4, 1985 /

Show other versions (1)
Bibliographic Details
Corporate Author: International Conference on Secondary Ion Mass Spectrometry Washington, D.C.
Other Authors: Benninghoven, A.
Format: Conference Proceeding Book
Language:English
Published: Berlin ; New York : Springer-Verlag, [1986]
Series:Springer series in chemical physics ; v. 44.
Subjects:
Secondary ion mass spectrometry > Congresses.

Remote Storage

Holdings details from Remote Storage
Call Number: QD96.S43 I58 1985
 
Call Number Status Get It
QD96.S43 I58 1985 Available