An International Conference on Thermal Infrared Sensing for Diagnostics and Control (Thermosense VIII) : September 17-20, 1985, Cambridge, Massachusetts /

Bibliographic Details
Corporate Authors: International Conference on Thermal Infrared Sensing for Diagnostics and Control Cambridge, Mass., American Society for Testing and Materials, Society of Photo-optical Instrumentation Engineers
Other Authors: Kaplan, Herbert
Format: Conference Proceeding Book
Language:English
Published: Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1986]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 581.
Subjects:
Description
Physical Description:vi, 162 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographies and index.
ISBN:0892526165 (pbk.)