An International Conference on Thermal Infrared Sensing for Diagnostics and Control (Thermosense VIII) : September 17-20, 1985, Cambridge, Massachusetts /

Bibliographic Details
Corporate Authors:	International Conference on Thermal Infrared Sensing for Diagnostics and Control Cambridge, Mass., American Society for Testing and Materials, Society of Photo-optical Instrumentation Engineers
Other Authors:	Kaplan, Herbert
Format:	Conference Proceeding Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1986]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 581.
Subjects:	Thermography > Congresses.

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