APA (7th ed.) Citation

International Conference on Thermal Infrared Sensing for Diagnostics and Control Cambridge, Mass, American Society for Testing and Materials, Society of Photo-optical Instrumentation Engineers, & Kaplan, H. (1986). An International Conference on Thermal Infrared Sensing for Diagnostics and Control (Thermosense VIII): September 17-20, 1985, Cambridge, Massachusetts. SPIE--the International Society for Optical Engineering.

Chicago Style (17th ed.) Citation

International Conference on Thermal Infrared Sensing for Diagnostics and Control Cambridge, Mass, American Society for Testing and Materials, Society of Photo-optical Instrumentation Engineers, and Herbert Kaplan. An International Conference on Thermal Infrared Sensing for Diagnostics and Control (Thermosense VIII): September 17-20, 1985, Cambridge, Massachusetts. Bellingham, Wash., USA: SPIE--the International Society for Optical Engineering, 1986.

MLA (9th ed.) Citation

International Conference on Thermal Infrared Sensing for Diagnostics and Control Cambridge, Mass, et al. An International Conference on Thermal Infrared Sensing for Diagnostics and Control (Thermosense VIII): September 17-20, 1985, Cambridge, Massachusetts. SPIE--the International Society for Optical Engineering, 1986.