Proceedings /

Meeting the tests of time : International Test Conference, 1989 proceedings, August 29-31, 1989, Sheraton Washington Hotel, Washington, DC /
Published: (1989)

Testing in the 1980's : digest of papers, 1981 International Test Conference, October 27, 28 & 29, 1981 /
Published: (1981)

Automatic testing and evaluation of digital integrated circuits /
by: Healy, James T., 1940-
Published: (1981)

Testability concepts for digital ICs : the macro test approach /
by: Beenker, F. P. M. (Frans P. M.)
Published: (1995)

Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983 /
Published: (1983)

LSI & boards : digest of papers, 1979 Test Conference, October 23, 24 & 25, 1979, held at Cherry Hill, New Jersey /
Published: (1979)

An engineer's guide to automated testing of high-speed interfaces /
by: Moreira, José, 1975-, et al.
Published: (2016)

Proceedings of the 1st European Test Conference : Paris, April 12-14, 1989.
Published: (1989)

Proceedings : International Test Conference 1995.
Published: (1995)

Proceedings : International Test Conference 1991, [October 26-30, 1991, Opryland Hotel, Nashville, TN] /
Published: (1991)

Digital systems testing and testable design /
by: Abramovici, Miron
Published: (1990)

Proceedings of the ... International Conference on Microelectronic Test Structures /
Published: (1989)

Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 /
Published: (1983)

Electronics reliability and measurement technology : nondestructive evaluation /
Published: (1988)

Design-for-test for digital IC's and embedded core systems /
by: Crouch, Alfred L.
Published: (1999)

Proceedings : International Test Conference 1994.
Published: (1994)

Proceedings : International Test Conference 1997.
Published: (1997)

Developments in integrated circuit testing /
Published: (1987)

Proceedings /
Published: (2003)

Memory & LSI : digest of papers /
Published: (1977)

The future of test : International Test Conference, 1985 proceedings, November 19, 20, 21, 1985 /
Published: (1985)

Integration of test with design and manufacturing : International Test Conference, 1987, proceedings, September 1, 2, 3, 1987 /
Published: (1987)

Testing's impact on design & technology : International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986 /
Published: (1986)

Proceedings : International Test Conference 1996.
Published: (1996)

Micron and submicron integrated circuit metrology : August 22-23, 1985, San Diego, California /
Published: (1985)

New frontiers in testing : International Test Conference, 1988, proceedings : September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC /
Published: (1988)

Memory & LSI : digest of papers, 1974 Semiconductor Test Symposium, November 5-7, 1974 held at Cherry Hill, New Jersey, sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE.
Published: (1974)

Proceedings /

Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits.

Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980 /
Published: (1980)

Proceedings International Test Conference 2002 /
Published: (2002)

Proceedings International Test Conference 2003 : [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA /
Published: (2003)

Neural models and algorithms for digital testing /
by: Chakradhar, Srimat T.
Published: (1991)

Proceedings of the ... IEEE VLSI Test Symposium : VTS.

Proceedings, International Test Conference 1998.
Published: (1998)

Wafer-level testing and test during burn-in for integrated circuits / Sudarshan Bahukudumbi, Krishnendu Chakrabarty.
by: Bahukudumbi, Sudarshan
Published: (2010)