Proceedings /

Bibliographic Details
Corporate Authors:	IEEE Workshop on Simulation & Test Generation Environments San Francisco, Calif., IEEE Computer Society, IEEE Computer Society. Test Technology Committee
Format:	Conference Proceeding Book
Language:	English
Published:	Washington, D.C. : Los Angeles, CA : IEEE Computer Society Press ; Order from IEEE Computer Society, [1986]
Subjects:	Integrated circuits > Testing > Congresses. Automatic test equipment > Congresses.

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