Cover Image

Proceedings /

Bibliographic Details
Corporate Authors: IEEE Workshop on Simulation & Test Generation Environments San Francisco, Calif., IEEE Computer Society, IEEE Computer Society. Test Technology Committee
Format: Conference Proceeding Book
Language:English
Published: Washington, D.C. : Los Angeles, CA : IEEE Computer Society Press ; Order from IEEE Computer Society, [1986]
Subjects:
Integrated circuits > Testing > Congresses.
Automatic test equipment > Congresses.
Description
Item Description:"IEEE Computer Society order number 732."
"IEEE catalog number 86CH2296-2."
Physical Description:vii, 179 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographies and index.
ISBN:0818607327 (pbk.)
0818687320 (hard)
0818647329 (microfiche)