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Examining the submicron world /

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Bibliographic Details
Corporate Author: NATO Advanced Study Institute on Improved Methods for Examining the Submicron World Nova Scotia
Other Authors: Feder, Ralph, McGowan, J. William (James William), 1931-, Shinozaki, Douglas M.
Format: Conference Proceeding Book
Language:English
Published: New York : Plenum Press, [1986]
Series:NATO ASI series. Physics ; v. 137.
Subjects:
Electron microscopy > Congresses.
X-ray microscopes > Congresses.
Ultrastructure (Biology) > Congresses.

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Call Number: QH212.E4 N37 1984
 
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QH212.E4 N37 1984 Available