Cover Image

X-ray imaging II : 21-22 August 1986, San Diego, California /

Bibliographic Details
Corporate Author: University of Rochester. Institute of Optics
Other Authors: Knight, Larry V., Bowen, D. Keith (David Keith), 1940-
Format: Book
Language:English
Published: Bellingham, Washington : SPIE-The International Society for Optical Engineering, [1986]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 691.
Subjects:
Imaging systems > Congresses.
X-rays > Congresses.
Optics > Congresses.
Description
Physical Description:vi, 149 pages : illustrations (some color) ; 28 cm.
Bibliography:Includes bibliographies and index.
ISBN:0892527269