X-ray imaging II : 21-22 August 1986, San Diego, California /

Bibliographic Details
Corporate Author:	University of Rochester. Institute of Optics
Other Authors:	Knight, Larry V., Bowen, D. Keith (David Keith), 1940-
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE-The International Society for Optical Engineering, [1986]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 691.
Subjects:	Imaging systems > Congresses. X-rays > Congresses. Optics > Congresses.

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