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Proceedings of the Symposium Mathematical Models, Accuracy Aspects and Quality Control, June 7-11, 1982, Helsinki University of Technology, Otaniemi, Finland /

Bibliographic Details
Corporate Authors: Symposium : Mathematical Models, Accuracy Aspects and Quality Control Helsinki University of Technology, International Society for Photogrammetry. Commission III
Other Authors: Hakkarainen, J., Kilpelä, Einari, Savolainen, Aino
Format: Conference Proceeding Book
Language:English
Published: [Otaniemi] : [Helsinki University of Technology], [1982]
Series:International archives of photogrammetry ; v. 24-III.
Subjects:
Photogrammetry > Congresses.
Photogrammetry > Mathematical models > Congresses.
Photogrammetry > Quality control > Congresses.
Description
Item Description:At head of title: International Society for Photogrammetry and Remote Sensing, Commission III.
Physical Description:632 pages : illustrations ; 29 cm.
Bibliography:Includes bibliographical references.