Proceedings of the Symposium Mathematical Models, Accuracy Aspects and Quality Control, June 7-11, 1982, Helsinki University of Technology, Otaniemi, Finland /

Bibliographic Details
Corporate Authors:	Symposium : Mathematical Models, Accuracy Aspects and Quality Control Helsinki University of Technology, International Society for Photogrammetry. Commission III
Other Authors:	Hakkarainen, J., Kilpelä, Einari, Savolainen, Aino
Format:	Conference Proceeding Book
Language:	English
Published:	[Otaniemi] : [Helsinki University of Technology], [1982]
Series:	International archives of photogrammetry ; v. 24-III.
Subjects:	Photogrammetry > Congresses. Photogrammetry > Mathematical models > Congresses. Photogrammetry > Quality control > Congresses.

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