Cover Image

Defect recognition and image processing in III-V compounds : proceedings of the International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985 /

Bibliographic Details
Corporate Author: International Symposium on Defect Recognition and Image Processing in III-V Compounds Montpellier, France
Other Authors: Fillard, J. P.
Format: Conference Proceeding Book
Language:English
Published: Amsterdam ; New York : Elsevier, 1985.
Series:Materials science monographs ; 31.
Subjects:
Semiconductors > Defects > Congresses.
Gallium arsenide > Congresses.
Image processing > Congresses.
Description
Physical Description:xii, 306 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographies and index.
ISBN:0444425586