Defect recognition and image processing in III-V compounds : proceedings of the International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985 /

Bibliographic Details
Corporate Author:	International Symposium on Defect Recognition and Image Processing in III-V Compounds Montpellier, France
Other Authors:	Fillard, J. P.
Format:	Conference Proceeding Book
Language:	English
Published:	Amsterdam ; New York : Elsevier, 1985.
Series:	Materials science monographs ; 31.
Subjects:	Semiconductors > Defects > Congresses. Gallium arsenide > Congresses. Image processing > Congresses.

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