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Internal structure of an electronics achievement test examined by a principal axes analysis and a homogeneous clustering technique /

Bibliographic Details
Main Author: Smith, Lyman John, 1923-
Format: Thesis Microform Book
Language:English
Published: [Place of publication not identified] : [publisher not identified] ; [1954]
Subjects:
Electronics > Examinations, questions, etc.
Electronic apparatus and appliances > Maintenance and repair > Examinations, questions, etc.

Evans: Microforms (3rd floor)

Holdings details from Evans: Microforms (3rd floor)
Call Number: film B 1142