Characterization and behavior of materials with submicron dimensions : proceedings from the conference /
| Corporate Authors: | , |
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Singapore :
World Scientific,
©1985.
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| Subjects: |
Remote Storage
| Call Number: |
TK7871.85 .C42 1985 |
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|---|---|---|
| Call Number | Status | Get It |
| TK7871.85 .C42 1985 | Available | |