Spectroscopic characterization techniques for semiconductor technology II : January 21-22, 1985, Los Angeles, California /
| Corporate Author: | |
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE--the International Society for Optical Engineering,
[1985]
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| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 524. |
| Subjects: | |
| Online Access: | https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/0524.toc |
| Physical Description: | vi, 169 pages : illustrations ; 28 cm. |
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| Bibliography: | Includes bibliographies and index. |
| ISBN: | 0892525592 (pbk.) |