Cover Image

Spectroscopic characterization techniques for semiconductor technology II : January 21-22, 1985, Los Angeles, California /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Pollak, Fred H.
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1985]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 524.
Subjects:
Semiconductors > Testing > Congresses.
Spectrum analysis > Congresses.
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/0524.toc

Internet

https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/0524.toc

Remote Storage

Holdings details from Remote Storage
Call Number: TK7871.85 .S725 1985
 
Call Number Status Get It
TK7871.85 .S725 1985 Available

Evans: Library Stacks

Holdings details from Evans: Library Stacks
Call Number: TK7871.85 .S725 1985
 
Call Number Status Get It
TK7871.85 .S725 1985 Missing