APA (7th ed.) Citation

Society of Photo-optical Instrumentation Engineers & Pollak, F. H. (1985). Spectroscopic characterization techniques for semiconductor technology II: January 21-22, 1985, Los Angeles, California. SPIE--the International Society for Optical Engineering.

Chicago Style (17th ed.) Citation

Society of Photo-optical Instrumentation Engineers and Fred H. Pollak. Spectroscopic Characterization Techniques for Semiconductor Technology II: January 21-22, 1985, Los Angeles, California. Bellingham, Wash., USA: SPIE--the International Society for Optical Engineering, 1985.

MLA (9th ed.) Citation

Society of Photo-optical Instrumentation Engineers and Fred H. Pollak. Spectroscopic Characterization Techniques for Semiconductor Technology II: January 21-22, 1985, Los Angeles, California. SPIE--the International Society for Optical Engineering, 1985.