Cover Image

Quality productivity profit : digest of papers : 1982 International Test Conference, November 15-18, 1982 /

Bibliographic Details
Corporate Authors: International Test Conference, IEEE Computer Society. Test Technology Committee, International Test Foundation, IEEE Computer Society, IEEE Computer Society. Philadelphia Section
Format: Conference Proceeding Book
Language:English
Published: Silver Spring, MD : IEEE Computer Society Press, [1982]
Subjects:
Integrated circuits > Testing > Congresses.
Automatic test equipment > Congresses.
Description
Item Description:Cover and spine title: IEEE International Test Conference.
Physical Description:xxiii, 672 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.