Quality productivity profit : digest of papers : 1982 International Test Conference, November 15-18, 1982 /

Bibliographic Details
Corporate Authors:	International Test Conference, IEEE Computer Society. Test Technology Committee, International Test Foundation, IEEE Computer Society, IEEE Computer Society. Philadelphia Section
Format:	Conference Proceeding Book
Language:	English
Published:	Silver Spring, MD : IEEE Computer Society Press, [1982]
Subjects:	Integrated circuits > Testing > Congresses. Automatic test equipment > Congresses.

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