Cover Image

Rational fault analysis /

Bibliographic Details
Corporate Authors: Symposium on Rational Fault Analysis Texas Tech University, United States. Office of Naval Research, United States. Army Research Office
Other Authors: Saeks, Richard, 1941-, Liberty, Stanley R., 1942-
Format: Conference Proceeding Book
Language:English
Published: New York : M. Dekker, [1977]
Series:Electrical engineering and electronics ; 1.
Subjects:
Electronic apparatus and appliances > Testing > Congresses.
Electronic apparatus and appliances > Reliability > Congresses.
Automatic test equipment > Congresses.
Description
Item Description:Co-sponsored by the Office of Naval Research and the Army Research Office.
Physical Description:ix, 241 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographies and index.
ISBN:0824765419