Rational fault analysis /

Bibliographic Details
Corporate Authors:	Symposium on Rational Fault Analysis Texas Tech University, United States. Office of Naval Research, United States. Army Research Office
Other Authors:	Saeks, Richard, 1941-, Liberty, Stanley R., 1942-
Format:	Conference Proceeding Book
Language:	English
Published:	New York : M. Dekker, [1977]
Series:	Electrical engineering and electronics ; 1.
Subjects:	Electronic apparatus and appliances > Testing > Congresses. Electronic apparatus and appliances > Reliability > Congresses. Automatic test equipment > Congresses.

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