Cover Image

Electron and ion microscopy and microanalysis : principles and applications /

Bibliographic Details
Main Author: Murr, Lawrence Eugene
Format: Book
Language:English
Published: New York : Marcel Dekker, [1982]
Series:Optical engineering (Marcel Dekker, Inc.) ; v. 1.
Subjects:
Electron microscopy.
Field ion microscopes.
Microprobe analysis.
Description
Physical Description:xiv, 793 pages : illustrations ; 27 cm.
Bibliography:Includes bibliographical references and indexes.
ISBN:0824715535