Electron and ion microscopy and microanalysis : principles and applications /

Bibliographic Details

Main Author:	Murr, Lawrence Eugene
Format:	Book
Language:	English
Published:	New York : Marcel Dekker, [1982]
Series:	Optical engineering (Marcel Dekker, Inc.) ; v. 1.
Subjects:	Electron microscopy. Field ion microscopes. Microprobe analysis.