Eastern Analytical Symposium New York, Murt, E. M., & Guldner, W. G. (1969). Physical measurement and analysis of thin films. Plenum Press.
Chicago Style (17th ed.) CitationEastern Analytical Symposium New York, E. M. Murt, and W. G. Guldner. Physical Measurement and Analysis of Thin Films. New York: Plenum Press, 1969.
MLA (9th ed.) CitationEastern Analytical Symposium New York, et al. Physical Measurement and Analysis of Thin Films. Plenum Press, 1969.
Warning: These citations may not always be 100% accurate.