Physical measurement and analysis of thin films /

Bibliographic Details

Corporate Author:	Eastern Analytical Symposium New York
Other Authors:	Murt, E. M., Guldner, W. G.
Format:	Conference Proceeding Book
Language:	English
Published:	New York : Plenum Press, 1969.
Series:	Progress in analytical chemistry ; v. 2.
Subjects:	Thin films.